Thin film thickness measurement equipment

Thin film thickness measurement equipment

thickness, thin film, semiconductor, measurement, thickness measurement,thin film thickness measurement,thickness gauge,film measurement,coating measurement,semiconductor,dielectric film, lcd, polymer, photoresist, automatic, cmp, endpoint, uv vis ir, color measurement, spectrometer

manufacturer of semiconductor thin film thickness measurement systems, capable of measuring oxide; nitride; polysilicon; photoresist; cie color; cmp; endpoint; and color filter by using uv, vis, nir, spectrometer. automatic and compact models are available.